Author:
Yosida Keisuke,Koganemaru Masaaki,Ikeda Toru,Miyazaki Noriyuki,Tomokage Hajime
Publisher
Japan Institute of Electronics Packaging
Subject
Electrical and Electronic Engineering
Cited by
4 articles.
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1. An Evaluation Method for Electrical Characteristics Variations on nMOSFETs under Uniaxial Stress Using Drift-Diffusion Device Simulation;Journal of The Japan Institute of Electronics Packaging;2012
2. Evaluation of Reliability of Electronic Power Devices and Modules;Journal of Japan Institute of Electronics Packaging;2012
3. 10.5104/jiep.14.413;Journal of Japan Institute of Electronics Packaging;2011
4. 10.4139/sfj.62.433;Journal of The Surface Finishing Society of Japan;2011