Exploring Process-Voltage-Temperature Variations Impact on 4T1R Multiplexers for Energy-aware Resistive RAM-based FPGAs

Author:

Rizzi Tommaso1,Baroni Andrea1,Glukhov Artem2,Bertozzi Davide3,Wenger Christian1,Ielmini Daniele2,Zambelli Cristian3

Affiliation:

1. IHP – Leibniz Institut fur innovative Mikroelektronik,Frankfurt (Oder),Germany,15236

2. Informazione e Bioingegneria (DEIB), Politecnico di Milano and IU.NET,Dipartimento di Elettronica,Milano,Italy,20133

3. Università degli Studi di Ferrara,Dip. di Ingegneria,Ferrara,Italy,44122

Funder

Deutsche Forschungsgemeinschaft

Ministry of Education

Publisher

IEEE

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Process-Voltage-Temperature Variations Assessment in Energy-Aware Resistive RAM-Based FPGAs;IEEE Transactions on Device and Materials Reliability;2023-09

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