Process-Voltage-Temperature Variations Assessment in Energy-Aware Resistive RAM-Based FPGAs-Reference-Cited by-同舟云学术

Process-Voltage-Temperature Variations Assessment in Energy-Aware Resistive RAM-Based FPGAs

Published:2023-09 Issue:3 Volume:23 Page:328-336
ISSN:1530-4388
Container-title:IEEE Transactions on Device and Materials Reliability
language:
Short-container-title:IEEE Trans. Device Mater. Relib.

Author:

Rizzi Tommaso¹^ORCID,Baroni Andrea¹^ORCID,Glukhov Artem²^ORCID,Bertozzi Davide³^ORCID,Wenger Christian¹^ORCID,Ielmini Daniele²^ORCID,Zambelli Cristian³^ORCID

Affiliation:

1. Materials Research Department, IHP-Leibniz Institut fur innovative Mikroelektronik, Frankfurt, Germany

2. Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano and IU.NET, Milan, Italy

3. Dipartimento di Ingegneria, Università degli Studi di Ferrara, Ferrara, Italy

Funder

Deutsche Forschungsgemeinschaft

Federal Ministry of Education and Research of Germany

Italian Ministry of University and Research

European Union (EU) through PON/REACT Project

ECSEL Joint Undertaking

European Union’s Horizon 2020 Research and Innovation Programme and France, Belgium, Czech Republic, Germany, Italy, Sweden, Switzerland, Turkey

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/7298/10242179/10076918.pdf?arnumber=10076918

Reference32 articles.

1. Performance Benefits of Monolithically Stacked 3-D FPGA

2. A high-performance low-power near-Vt RRAM-based FPGA

3. Post-P&R Performance and Power Analysis for RRAM-Based FPGAs

4. Scaling Constraints for Memristor-based Programmable Interconnect in Reconfigurable Computing Arrays

5. A High-Performance FPGA Architecture Using One-Level RRAM-Based Multiplexers

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1. ADC-Less Reprogrammable RRAM Array Architecture for In-Memory Computing;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-12

2. Exploring the NBTI Aging and PVT effects on RRAM-based FPGA Multiplexers Performance;2023 IEEE International Integrated Reliability Workshop (IIRW);2023-10-08