Process-Voltage-Temperature Variations Assessment in Energy-Aware Resistive RAM-Based FPGAs

Author:

Rizzi Tommaso1ORCID,Baroni Andrea1ORCID,Glukhov Artem2ORCID,Bertozzi Davide3ORCID,Wenger Christian1ORCID,Ielmini Daniele2ORCID,Zambelli Cristian3ORCID

Affiliation:

1. Materials Research Department, IHP-Leibniz Institut fur innovative Mikroelektronik, Frankfurt, Germany

2. Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano and IU.NET, Milan, Italy

3. Dipartimento di Ingegneria, Università degli Studi di Ferrara, Ferrara, Italy

Funder

Deutsche Forschungsgemeinschaft

Federal Ministry of Education and Research of Germany

Italian Ministry of University and Research

European Union (EU) through PON/REACT Project

ECSEL Joint Undertaking

European Union’s Horizon 2020 Research and Innovation Programme and France, Belgium, Czech Republic, Germany, Italy, Sweden, Switzerland, Turkey

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. ADC-Less Reprogrammable RRAM Array Architecture for In-Memory Computing;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-12

2. Exploring the NBTI Aging and PVT effects on RRAM-based FPGA Multiplexers Performance;2023 IEEE International Integrated Reliability Workshop (IIRW);2023-10-08

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