Conductive-filament switching analysis and self-accelerated thermal dissolution model for reset in NiO-based RRAM-Reference-Cited by-同舟云学术

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Conductive-filament switching analysis and self-accelerated thermal dissolution model for reset in NiO-based RRAM

Published:2007 Issue: Volume: Page:
ISSN:
Container-title:2007 IEEE International Electron Devices Meeting
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Author:

Russo U.,Ielmini D.,Cagli C.,Lacaita A. L.,Spiga S.,Wiemer C.,Perego M.,Fanciulli M.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4418847/4418848/04419062.pdf?arnumber=4419062

Cited by 182 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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