Test Input Prioritization for Machine Learning Classifiers

Author:

Dang Xueqi1ORCID,Li Yinghua1ORCID,Papadakis Mike1ORCID,Klein Jacques1ORCID,Bissyandé Tegawendé F.1ORCID,Traon Yves Le1ORCID

Affiliation:

1. University of Luxembourg, Kirchberg, Luxembourg

Funder

Luxembourg National Research Fund AFR PhD

European Research Council

Luxembourg National Research Funds

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Towards Exploring the Limitations of Test Selection Techniques on Graph Neural Networks: An Empirical Study;Empirical Software Engineering;2024-07-22

2. Prioritizing test cases for deep learning-based video classifiers;Empirical Software Engineering;2024-07-22

3. Test Input Prioritization for 3D Point Clouds;ACM Transactions on Software Engineering and Methodology;2024-06-04

4. Test Input Prioritization for Graph Neural Networks;IEEE Transactions on Software Engineering;2024-06

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