Author:
Liu C.,Krishnendu Chakrabarty
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
13 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Dummy Faulty Units for Reduced Fail Data Volume From Logic Faults;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-11
2. Partially-Specified Output Response for Reduced Fail Data Volume;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022
3. Hybrid Pass/Fail and Full Fail Data for Reduced Fail Data Volume;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021-08
4. Logic Diagnosis with Hybrid Fail Data;ACM Transactions on Design Automation of Electronic Systems;2021-05-31
5. Soft Fault Diagnosis Using URV-LDA Transformed Feature Dictionary;IEEE Access;2021