Author:
Ito Kyosuke,Matsumoto Takashi,Nishizawa Shinichi,Sunagawa Hiroki,Kobayashi Kazutoshi,Onodera Hidetoshi
Cited by
22 articles.
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1. Characterizing and Modeling RTN Under Real Circuit Bias Conditions;IEEE Transactions on Electron Devices;2023-05
2. Measurement Results of Real Circuit Delay Degradation under Realistic Workload;IPSJ Transactions on System and LSI Design Methodology;2023
3. AC RTN: Testing, Modeling, and Prediction;IEEE Transactions on Electron Devices;2022-10
4. An Integral Methodology for Predicting Long-Term RTN;IEEE Transactions on Electron Devices;2022-07
5. A novel Physical Unclonable Function using RTN;2022 IEEE International Symposium on Circuits and Systems (ISCAS);2022-05-28