AC RTN: Testing, Modeling, and Prediction
Author:
Affiliation:
1. School of Engineering, Liverpool John Moores University, Liverpool, U.K.
Funder
Engineering and Physical Science Research Council of U.K
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/16/9901396/09852245.pdf?arnumber=9852245
Reference28 articles.
1. An Assessment of the Statistical Distribution of Random Telegraph Noise Time Constants
2. Time-dependent variation: A new defect-based prediction methodology
3. Understanding short-term BTI behavior through comprehensive observation of gate-voltage dependence of RTN in highly scaled high-K/metal-gate pFETs;miki;Proc Very Large Scale Integration Tech Symp,2011
4. Statistical characterization of trap position, energy, amplitude and time constants by RTN measurement of multiple individual traps
5. Trigger-When-Charged: A Technique for Directly Measuring RTN and BTI-Induced Threshold Voltage Fluctuation Under Use- ${V}_{dd}$
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Extracting statistical distributions of RTN originating from both acceptor-like and donor-like traps;2023 IEEE 15th International Conference on ASIC (ASICON);2023-10-24
2. Characterizing and Modeling RTN Under Real Circuit Bias Conditions;IEEE Transactions on Electron Devices;2023-05
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