A novel flow for reducing clock skew considering NBTI effect and process variations-Reference-Cited by-同舟云学术

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A novel flow for reducing clock skew considering NBTI effect and process variations

Published:2013-03 Issue: Volume: Page:
ISSN:
Container-title:International Symposium on Quality Electronic Design (ISQED)
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Author:

Jifeng Chen ,Tehranipoor M.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/6520923/6523572/06523630.pdf?arnumber=6523630

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Making Aging Useful by Recycling Aging-induced Clock Skew;ACM Transactions on Design Automation of Electronic Systems;2020-03-17

2. Analytical parameter extraction for NBTI reaction diffusion and trapping/detrapping models;Microelectronics Reliability;2016-11

3. BTI-Gater: An Aging-Resilient Clock Gating Methodology;IEEE Journal on Emerging and Selected Topics in Circuits and Systems;2014-06

4. Critical Paths Selection and Test Cost Reduction Considering Process Variations;2013 22nd Asian Test Symposium;2013-11

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