Author:
Wang YanLing,Li XiaoJin,Qing Jian,Zeng Yan,Shi YanLing,Guo Ao,Hu ShaoJian,Chen Shoumian,Zhao Yuhang
Funder
National Natural Science Foundation of China
Shanghai Natural Science Foundation
Science and Technology Commission of Shanghai Municipality
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. Gate merging: an NBTI mitigation method to eliminate critical internal nodes in digital circuits;Ghane,2016
2. A modeling framework for NBTI degradation under dynamic voltage and frequency scaling;Parihar;IEEE Trans. Electron Devices,2016
3. Physics matters: statistical aging prediction under trapping/detrapping;Velamala,2012
4. A Novel Flow for Reducing Clock Skew Considering NBTI Effect and Process Variations;Chen,2013
5. Predictive modeling of the NBTI effect of reliable design;Bhardwaj;IEEE Custom Integr. Circ. Conf. (CICC),2006
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