Physics of failure-based failure mode, effects, and criticality analysis for Integrated Circuits
Author:
Affiliation:
1. Department of Test Engineering; Mechanical Engineering College; Shijiazhuang China
2. Testability Laboratory; Mechanical Technological Research Institute; Shijiazhuang China
Funder
National Defense Pre-Research Foundation of China
Publisher
Wiley
Subject
Computer Networks and Communications,Hardware and Architecture
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/sys.21451/fullpdf
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