Test sample allocation method for testability verification test

Author:

Qiu Wenhao1ORCID,Lian Guangyao2,Zhou Peng3,Huang Kaoli1

Affiliation:

1. Test Engineering DepartmentArmy Engineering University, Shijiazhuang Campus Shijiazhuang China

2. Testability LaboratoryMechanical Technological Research Institute Shijiazhuang China

3. Teaching Support DepartmentArmy Engineering University Nanjing China

Publisher

Wiley

Subject

Management Science and Operations Research,Safety, Risk, Reliability and Quality

Reference25 articles.

1. Testability enhancement of a basic set of CMOS cells

2. EvangelineC SivamangaiNM.Evaluation of testability of digital circuits by fault injection technique(2'nd International Conference on Electronics and Communication Systems) Coimbatore 2015;92–96.

3. Built‐in self‐test methodology for system‐on‐a‐chip testing;Sivanantham S;J Sci Ind Res,2017

4. Department of Defense United States of America.MIL‐STD‐471A interim notice 2 demonstration and evaluation of equipment/system build‐in test/attributes and requirements(US. Government Printing Diffice)1978.

5. PliskaTF AngusJE JewFL.BIT/external test figures of merit and demonstration techniques(AD‐A081128)1979.

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Sample allocation method for maintainability test based on extended FMECA information;Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability;2024-07-23

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3