A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI-Reference-Cited by-同舟云学术

A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI

Published:2019-02 Issue:2 Volume:54 Page:476-488
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Diaz-Fortuny Javier^ORCID,Martin-Martinez Javier^ORCID,Rodriguez Rosana^ORCID,Castro-Lopez Rafael^ORCID,Roca Elisenda^ORCID,Aragones Xavier^ORCID,Barajas Enrique^ORCID,Mateo Diego^ORCID,Fernandez Francisco V.^ORCID,Nafria Montserrat^ORCID

Funder

Secretaría de Estado de Investigación, Desarrollo e Innovación

Agencia de Innovación y Desarrollo de Andalucía

MINECO

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/4/8629373/08563053.pdf?arnumber=8563053

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