Author:
Keane John,Zhang Wei,Kim Chris H.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
19 articles.
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1. Domain-Specific Machine Learning Based Minimum Operating Voltage Prediction Using On-Chip Monitor Data;2023 IEEE International Test Conference (ITC);2023-10-07
2. A Test Module for Aging Characterization of Digital Circuits;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03
3. Research on Aging State Prediction Method of Computing Chip System;2023 6th International Conference on Electronics Technology (ICET);2023-05-12
4. Q&R On-Chip (QROC): A Unified, Oven-less and Scalable Circuit Reliability Platform;2022 IEEE International Reliability Physics Symposium (IRPS);2022-03
5. A Calibration-Free Synthesizable Odometer Featuring Automatic Frequency Dead Zone Escape and Start-up Glitch Removal;2022 IEEE International Reliability Physics Symposium (IRPS);2022-03