A Calibration-Free Synthesizable Odometer Featuring Automatic Frequency Dead Zone Escape and Start-up Glitch Removal
Author:
Affiliation:
1. University of Minnesota,Department of Electrical and Computer Engineering,Minneapolis,MN,USA,55455
2. NXP Semiconductors,Austin,TX,USA,78735
Funder
Semiconductor Research Corporation
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9764406/9764408/09764518.pdf?arnumber=9764518
Reference5 articles.
1. An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array
2. An Array-Based Odometer System for Statistically Significant Circuit Aging Characterization
3. Evidence That Two Tightly Coupled Mechanisms Are Responsible for Negative Bias Temperature Instability in Oxynitride MOSFETs
4. An All-In-One Silicon Odometer for Separately Monitoring HCI, BTI, and TDDB
5. Silicon Odometer: An On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits
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