Research on Aging State Prediction Method of Computing Chip System
Author:
Affiliation:
1. University of Electronic Science and Technology of China,School of Automation Engineer,Chengdu,China
2. Testing Center of the 58th Research Institute of China Electronics Technology Group,Wuxi,China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10210847/10211258/10211394.pdf?arnumber=10211394
Reference12 articles.
1. An Array-Based Odometer System for Statistically Significant Circuit Aging Characterization
2. Duty-cycle shift under asymmetric BTI aging: A simple characterization method and its application to SRAM timing
3. Design of Reliable SoCs With BIST Hardware and Machine Learning
4. Design of Accurate Low-Cost On-Chip Structures for Protecting Integrated Circuits Against Recycling
5. Postsilicon Voltage Guard-Band Reduction in a 22 nm Graphics Execution Core Using Adaptive Voltage Scaling and Dynamic Power Gating
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