An All-Digital Unified Physically Unclonable Function and True Random Number Generator Featuring Self-Calibrating Hierarchical Von Neumann Extraction in 14-nm Tri-gate CMOS-Reference-Cited by-同舟云学术

An All-Digital Unified Physically Unclonable Function and True Random Number Generator Featuring Self-Calibrating Hierarchical Von Neumann Extraction in 14-nm Tri-gate CMOS

Published:2019-04 Issue:4 Volume:54 Page:1074-1085
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Satpathy Sudhir K.^ORCID,Mathew Sanu K.^ORCID,Kumar Raghavan,Suresh Vikram,Anders Mark A.,Kaul Himanshu,Agarwal Amit^ORCID,Hsu Steven,Krishnamurthy Ram K.,De Vivek^ORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/4/8674728/08600398.pdf?arnumber=8600398

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