A 0.012‐mm2 0.244‐pJ/bit successive approximation register analog‐to‐digital converter‐based true random number generator for Internet of Things applications in a 65‐nm complementary metal–oxide–semiconductor

Author:

Cheng Kai1,Chen Yong1ORCID,Stefano Crovetti Paolo2,Martins Rui P.13ORCID,Mak Pui‐In1

Affiliation:

1. State‐Key Laboratory of Analog and Mixed‐Signal VLSI and IME/ECE‐FST University of Macau Macau China

2. Department of Electronics and Telecommunications (DET) Politecnico di Torino Torino Italy

3. On leave from the Instituto Superior Técnico Universidade de Lisboa Lisbon Portugal

Abstract

SummaryThis paper proposes a true random number generator (TRNG) based on a successive approximation register (SAR) analog‐to‐digital converter (ADC). A top‐plate sampling SAR ADC structure and a new MSB‐isolation switch scheme (MISS) are combined to achieve low‐power operation and small area occupancy at the same time. When the SAR ADC has completed its conversion, a secondary firing of the comparator measures the remaining signal. This 1‐bit quantized residue serves as the true random sequence, thus eliminating the need for extra circuitry in the TRNG. A 65‐nm prototype of the proposed TRNG was found to occupy an area of 0.012 mm2 and successfully passed all the National Institute of Standards and Technology (NIST) tests without post‐processing. It achieved a figure‐of‐merit of 0.244 pJ/bit for a 1 Mb/s random sequence with a 0.8‐V power supply. Its resilience to power noise injection attacks was also verified.

Funder

National Institute of Standards and Technology

Publisher

Wiley

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