Gate engineering for deep-submicron CMOS transistors-Reference-Cited by-同舟云学术

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Gate engineering for deep-submicron CMOS transistors

Published:1998-06 Issue:6 Volume:45 Page:1253-1262
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Bin Yu ,Dong-Hyuk Ju ,Wen-Chin Lee ,Kepler N.,Tsu-Jae King ,Chenming Hu

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx4/16/14932/00678529.pdf?arnumber=678529

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