Author:
Abadir M.S.,Ferguson J.,Kirkland T.E.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
85 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Testability Evaluation for Local Design Modifications;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-01
2. FEEP: Functional ECO Synthesis with Efficient Patch Minimization;2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS);2023-06-11
3. Fault diagnosis and fault tolerance;System Assurances;2022
4. Unstructured brainstorming is not enough: structured brainstorming based on four verification and validation questions yields better hazard identification in healthcare;International Journal for Quality in Health Care;2018-10-05
5. Test Coverage;VLSI Design and Test for Systems Dependability;2018-07-21