30.2 A 1Tb 4b/Cell 144-Tier Floating-Gate 3D-NAND Flash Memory with 40MB/s Program Throughput and 13.8Gb/mm2 Bit Density

Author:

Khakifirooz Ali,Balasubrahmanyam Sriram,Fastow Richard,Gaewsky Kristopher H.,Ha Chang Wan,Haque Rezaul,Jungroth Owen W.,Law Steven,Madraswala Aliasgar S.,Ngo Binh,Naveen Prabhu V,Rajwade Shantanu,Ramamurthi Karthikeyan,Shenoy Rohit S.,Snyder Jacqueline,Sun Cindy,Thimmegowda Deepak,Pathak Bharat M.,Kalavade Pranav

Publisher

IEEE

Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Comparing the Reliability of Solid-State Drives Based on TLC and QLC NAND Flash Memories (Invited);2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14

2. Exploring the Reliability Limits for the Z-Pitch Scaling of Molybdenum Inter-Word Line Oxides in 3D NAND;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14

3. Libra: A Space-Efficient, High-Performance Inline Deduplication for Emerging Hybrid Storage System;2023 IEEE Intl Conf on Parallel & Distributed Processing with Applications, Big Data & Cloud Computing, Sustainable Computing & Communications, Social Computing & Networking (ISPA/BDCloud/SocialCom/SustainCom);2023-12-21

4. Investigation of Erase Cycling Induced Joint Dummy Cell Disturbance in Dual-Deck 3D NAND Flash Memory;Micromachines;2023-10-09

5. A Review of Program disturb of 3D NAND Flash Memory;2023 24th International Conference on Electronic Packaging Technology (ICEPT);2023-08-08

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