Author:
Khakifirooz Ali,Balasubrahmanyam Sriram,Fastow Richard,Gaewsky Kristopher H.,Ha Chang Wan,Haque Rezaul,Jungroth Owen W.,Law Steven,Madraswala Aliasgar S.,Ngo Binh,Naveen Prabhu V,Rajwade Shantanu,Ramamurthi Karthikeyan,Shenoy Rohit S.,Snyder Jacqueline,Sun Cindy,Thimmegowda Deepak,Pathak Bharat M.,Kalavade Pranav
Cited by
22 articles.
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4. Investigation of Erase Cycling Induced Joint Dummy Cell Disturbance in Dual-Deck 3D NAND Flash Memory;Micromachines;2023-10-09
5. A Review of Program disturb of 3D NAND Flash Memory;2023 24th International Conference on Electronic Packaging Technology (ICEPT);2023-08-08