A 16Gb 9.5Gb/S/pin LPDDR5X SDRAM With Low-Power Schemes Exploiting Dynamic Voltage-Frequency Scaling and Offset-Calibrated Readout Sense Amplifiers in a Fourth Generation 10nm DRAM Process
Author:
Affiliation:
1. Samsung Electronics,Hwaseong,Korea
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9731529/9731102/09731537.pdf?arnumber=9731537
Reference5 articles.
1. A 16Gb 18Gb/S/pin GDDR6 DRAM with per-bit trainable single-ended DFE and PLL-less clocking
2. 25.2 A 16Gb Sub-1V 7.14Gb/s/pin LPDDR5 SDRAM Applying a Mosaic Architecture with a Short-Feedback 1-Tap DFE, an FSS Bus with Low-Level Swing and an Adaptively Controlled Body Biasing in a 3rd-Generation 10nm DRAM
3. A 16Gb LPDDR4X SDRAM with an NBTI-tolerant circuit solution, an SWD PMOS GIDL reduction technique, an adaptive gear-down scheme and a metastable-free DQS aligner in a 10nm class DRAM process
4. 22.2 An 8.5Gb/s/pin 12Gb-LPDDR5 SDRAM with a Hybrid-Bank Architecture using Skew-Tolerant, Low-Power and Speed-Boosting Techniques in a 2nd generation 10nm DRAM Process
5. A 7.5Gb/s/pi? LPDDR5 SDRAM with WCK Clocking and Non-Target ODT for High Speed and with DVFS, Internal Data Copy, and Deep-Sleep Mode for Low Power;ha;ISSCC,0
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