I/sub DDQ/ testing of bridging faults in logic resources of reconfigurable field programmable gate arrays

Author:

Lan Zhao ,Walker D.M.H.,Lombardi F.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Research on time parameter measurement technology of digital integrated circuit based on FPGA;2023 IEEE 6th International Conference on Information Systems and Computer Aided Education (ICISCAE);2023-09-23

2. Current-Based Testing, Modeling and Monitoring for Operational Deterioration of a Memristor-Based LUT;Journal of Electronic Testing;2016-08-31

3. FPGA Fault Tolerant Arithmetic Logic: A Case Study Using Parallel-Prefix Adders;VLSI Design;2013-11-07

4. Single‐configuration fault detection in application‐dependent testing of field programmable gate array interconnects;IET Computers & Digital Techniques;2013-05

5. Design-specific path delay testing in lookup-table-based FPGAs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2006-05

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