Single‐configuration fault detection in application‐dependent testing of field programmable gate array interconnects-Reference-Cited by-同舟云学术

Single‐configuration fault detection in application‐dependent testing of field programmable gate array interconnects

Published:2013-05 Issue:3 Volume:7 Page:132-141
ISSN:1751-8601
Container-title:IET Computers & Digital Techniques
language:en
Short-container-title:IET Computers & Digital Techniques

Author:

Nandha Kumar Thulasiraman¹,Almurib Haider Abbas F.¹,Lombardi Fabrizio²

Affiliation:

1. Electrical and Electronic EngineeringThe University of Nottingham Malaysia CampusSelangorMalaysia

2. Department of Electrical and Computer EngineeringNortheastern UniversityBoston02115USA

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-cdt.2012.0117

Reference27 articles.

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3. Iddq testing of bridging faults in logic resources of reconfigurable FPGAs;Zhao L.;IEEE Trans. Comput.,1998

4. Tahoori M.B. McCluskey E.J. Renovell M. Faure P.: ‘A multi‐ configuration strategy for an application dependent testing of FPGAs’.Proc. 22nd IEEE VLSI Test Symp. April2004 pp.154–159

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