Application-Dependent Testing of FPGAs-Reference-Cited by-同舟云学术

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Application-Dependent Testing of FPGAs

Published:2006-09 Issue:9 Volume:14 Page:1024-1033
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Tahoori M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx5/92/36101/01715334.pdf?arnumber=1715334

Cited by 31 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Novel Approach for Offline and Online Application-Dependent testing of FPGA interconnects;2023 5th Iranian International Conference on Microelectronics (IICM);2023-10-25

2. Evaluation of the SEU Faults Coverage of a Simple Fault Model for Application-Oriented FPGA Testing;2020 23rd Euromicro Conference on Digital System Design (DSD);2020-08

3. ATTEST: Application-Agnostic Testing of a Novel Transistor-Level Programmable Fabric;2020 IEEE 38th VLSI Test Symposium (VTS);2020-04

4. On-Chip Delay Measurement for In-Field Test of FPGAs;2019 IEEE 24th Pacific Rim International Symposium on Dependable Computing (PRDC);2019-12

5. An Integrated Framework for Application Independent Testing of FPGA Interconnect;Journal of Electronic Testing;2019-10

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