Current-Based Testing, Modeling and Monitoring for Operational Deterioration of a Memristor-Based LUT
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/article/10.1007/s10836-016-5611-3/fulltext.html
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3. Almurib HAF, Kumar TN, Lombardi F (2014) A memristor-based LUT for FPGAs. In Proc. of 9th IEEE International Conference on Nano/Micro Engineered and Molecular System IEEE-NEMS, pp 448–453
4. Almurib HAF, Kumar TN, Lombardi F (2014) Scalable application-dependent diagnosis of interconnects of SRAM-based FPGAs. IEEE Trans Comput 63(6):1540–1550
5. Biolek Z, Biolek D, Biolova V (2009) SPICE model of memristor with nonlinear Dopant drift. Radioengineering 18(2):210–214
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