A consistent model for the thickness dependence of intrinsic breakdown in ultra-thin oxides-Reference-Cited by-同舟云学术

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A consistent model for the thickness dependence of intrinsic breakdown in ultra-thin oxides

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Container-title:Proceedings of International Electron Devices Meeting
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Author:

Degraeve R.,Groeseneken G.,Bellens R.,Depas M.,Maes H.E.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx3/3584/10696/00499353.pdf?arnumber=499353

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