Characterization and modeling of hysteresis phenomena in high K dielectrics-Reference-Cited by-同舟云学术

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Characterization and modeling of hysteresis phenomena in high K dielectrics

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Container-title:IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004.
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Author:

Leroux C.,Mitard J.,Ghibaud G.,Garros X.,Reimbold G.,Guillaumot B.,Martin F.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/9719/30682/01419276.pdf?arnumber=1419276

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