GaN double ifeterojunction field effect transistor for microwave and millimeterwave power applications

Author:

Micovic M.,Hashimoto P.,Hu M.,MilosavIjevic I.,Duvall J.,Willadsen P.J.,Wong W.S.,Conway A.M.,Kurdoghlian A.,Deelman P.W.,Moon J.-S.,Schmitz A.,Delaney M.J.

Publisher

IEEE

Cited by 83 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Characterization of Trapping Effects Related to Carbon Doping Level in AlGaN Back-Barriers for AlGaN/GaN HEMTs;IEEE Transactions on Electron Devices;2024-06

2. Comparative Investigation of Single and Double Channel AlGaN/GaN HEMTs for LNAs;Springer Proceedings in Physics;2024

3. Influence of Upper Channel Thickness on InAlN/GaN/InAlN/GaN Double Channel HEMT;2023 20th China International Forum on Solid State Lighting & 2023 9th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS);2023-11-27

4. Scaling of E-mode power GaN-HEMTs for low voltage/low Ron applications: Implications on robustness;Microelectronics Reliability;2023-11

5. A Composite AlGaN/cGaN Back Barrier for mm-Wave GaN-on-Si HEMTs;ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC);2023-09-11

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