Extraction of virtual-source injection velocity in sub-100 nm III–V HFETs-Reference-Cited by-同舟云学术

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Extraction of virtual-source injection velocity in sub-100 nm III–V HFETs

Published:2009-12 Issue: Volume: Page:
ISSN:
Container-title:2009 IEEE International Electron Devices Meeting (IEDM)
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Author:

Kim D.-H.,del Alamo J. A.,Antoniadis D. A.,Brar B.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5419306/5424206/05424268.pdf?arnumber=5424268

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