Author:
Bojoi Radu,Fusillo Filadelfo,Raciti Angelo,Musumeci Salvatore,Scrimizzi Filippo,Rizzo Santi
Cited by
9 articles.
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1. Ruggedness of Silicon Power MOSFETs–Part II: Device Design Failures and Modeling: A Review;IEEE Transactions on Electron Devices;2024-06
2. Trench Split Gate MOSFET’s Inductive Switching;IEEE Transactions on Electron Devices;2022-09
3. Reliability Prediction and Assessment Models for Power Components: A Comparative Analysis;Archives of Computational Methods in Engineering;2022-08-23
4. Modelling and Experimental Validation of GaN Based Power Converter for LED Driver;2022 IEEE International Conference on Environment and Electrical Engineering and 2022 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe);2022-06-28
5. Wide SOA MOSFET technology for hot swap and inrush current limiter solutions;2021 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE);2021-11-17