Wide SOA MOSFET technology for hot swap and inrush current limiter solutions
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Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9662653/9662685/09662951.pdf?arnumber=9662951
Reference7 articles.
1. Electro-thermal instability in low voltage power MOS: Experimental characterization
2. Low Voltage Trench-Gate MOSFETs for High Efficiency Auxiliary Power Supply Applications
3. A new thermal model for power MOSFET devices accounting for the behavior in unclamped inductive switching
4. Investigations on Electro- Instability of Low Voltage Power MOSFETs: Theoretical Models and Experimental comparison results for different structures;consentino;PET 2004 Conference,2004
5. Low Voltage Trench-Gate MOSFET Power Losses Optimization in Synchronous Buck Converter Applications
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Above 48% Improvement of Wide SOA Enhancement Technology and Mechanism for 30-V SGT MOSFET on Application of Hot-Swap;2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD);2024-06-02
2. A Split-Gate Power MOSFET Obtaining Ultra-Wide SOA Based on Time-Shared and Partitioned Conduction Gate Control;IEEE Journal of Emerging and Selected Topics in Power Electronics;2024-04
3. Modeling and design of a low-cost constant current electronic load;2023 15th Seminar on Power Electronics and Control (SEPOC);2023-10-22
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