Effects of inorganic encapsulation on power cycling lifetime of aluminum bond wires
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/8387225/8393579/08393648.pdf?arnumber=8393648
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A Fatigue Lifetime Prediction Model for Aluminum Bonding Wires;Metals;2023-10-21
2. State-of-the-art of the bond wire failure mechanism and power cycling lifetime in power electronics;Microelectronics Reliability;2023-08
3. Parametric study on relevant design and material parameters for reliable hard encapsulation of automotive power modules;2022 IEEE 24th Electronics Packaging Technology Conference (EPTC);2022-12-07
4. Lifting-Off of Al Bonding Wires in IGBT Modules Under Power Cycling: Failure Mechanism and Lifetime Model;IEEE Journal of Emerging and Selected Topics in Power Electronics;2020-09
5. A Fully On-Chip Frequency-Stabilization Mechanism for Terahertz Sources Eliminating Frequency Reference and Dividers;IEEE Transactions on Microwave Theory and Techniques;2019-07
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