Silent Data Errors: Sources, Detection, and Modeling

Author:

Singh Adit1,Chakravarty Sreejit2,Papadimitriou George3,Gizopoulos Dimitris3

Affiliation:

1. Auburn University,Auburn,AL,USA

2. Intel,Santa Clara,CA,USA

3. University of Athens,Greece

Funder

National Science Foundation

Horizon Europe

Publisher

IEEE

Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Aggravated NBTI reliability due to hard-to-detect open defects;Microelectronics Reliability;2024-09

2. Multi-transition delay test for improving the coverage of cell internal defects;IEICE Electronics Express;2024-08-10

3. Silent Data Corruptions in Computing: Understand and Quantify;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03

4. Harpocrates: Breaking the Silence of CPU Faults through Hardware-in-the-Loop Program Generation;2024 ACM/IEEE 51st Annual International Symposium on Computer Architecture (ISCA);2024-06-29

5. Silent Data Corruptions in Computing Systems: Early Predictions and Large-Scale Measurements;2024 IEEE European Test Symposium (ETS);2024-05-20

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