Pulsed $I_{d}$– $V_{g}$ Methodology and Its Application to Electron-Trapping Characterization and Defect Density Profiling-Reference-Cited by-同舟云学术

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Pulsed $I_{d}$– $V_{g}$ Methodology and Its Application to Electron-Trapping Characterization and Defect Density Profiling

Published:2009-06 Issue:6 Volume:56 Page:1322-1329
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Young Chadwin D.,Zhao Yuegang,Heh Dawei,Choi Rino,Lee Byoung Hun,Bersuker Gennadi

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/4957556/04909057.pdf?arnumber=4909057

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