Automated Detection and Localization of Counterfeit Chip Defects by Texture Analysis in Infrared (IR) Domain-Reference-Cited by-同舟云学术

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Automated Detection and Localization of Counterfeit Chip Defects by Texture Analysis in Infrared (IR) Domain

Published:2020-12-15 Issue: Volume: Page:
ISSN:
Container-title:2020 IEEE Physical Assurance and Inspection of Electronics (PAINE)
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Author:

Ghosh Pallabi,Botero Ulbert J,Ganji Fatemeh,Woodard Damon,Chakraborty Rajat Subhra,Forte Domenic

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9337561/9337562/09337739.pdf?arnumber=9337739

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Recycled Counterfeit Chips Detection for AMS and Digital ICs Using Low-Area, Self-Contained, and Secure LDO Odometers;Journal of Hardware and Systems Security;2024-07-18

2. MaGNIFIES: Manageable GAN Image Augmentation Framework for Inspection of Electronic Systems;Journal of Hardware and Systems Security;2024-02-19

3. High-Speed and Accurate Cascade Detection Method for Chip Surface Defects;IEEE Transactions on Instrumentation and Measurement;2024

4. Counterfeit Chip Detection using Scattering Parameter Analysis;2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS);2023-05-03

5. CAD for Anti-counterfeiting;CAD for Hardware Security;2023

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