High-Speed and Accurate Cascade Detection Method for Chip Surface Defects
Author:
Affiliation:
1. Advanced Manufacturing Department, Tsinghua University, Shenzhen, China
Funder
University Key Projects
Technical Breakthrough Projects of Shenzhen Science and Technology Innovation Commission
Shenzhen Grand Technology Corporation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Link
http://xplorestaging.ieee.org/ielx7/19/10367905/10403812.pdf?arnumber=10403812
Reference31 articles.
1. A Small-Sized Object Detection Oriented Multi-Scale Feature Fusion Approach With Application to Defect Detection
2. YOLOX: Exceeding YOLO series in 2021;Ge;arXiv:2107.08430,2021
3. Detection of Weak Defects in Weld Joints Based on Poisson Fusion and Deep Learning
4. Attention-based deep learning for chip-surface-defect detection
5. Pixel recurrent neural networks;Van Den Oord
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