Attention-based deep learning for chip-surface-defect detection

Author:

Wang Shuo,Wang Hongyu,Yang Fan,Liu Fei,Zeng Long

Funder

National Natural Science Foundation of China

Publisher

Springer Science and Business Media LLC

Subject

Industrial and Manufacturing Engineering,Computer Science Applications,Mechanical Engineering,Software,Control and Systems Engineering

Reference36 articles.

1. Zheng X, Zheng S, Kong Y, Chen J (2021) Recent advances in surface defect inspection of industrial products using deep learning techniques. Int J Adv Manuf Technol 1–24

2. Tao X, Hou W, Xu D (2020) A survey of surface defect detection methods based on deep learning. Acta Automatica Sinica 1:19

3. Wang T, Chen Y, Qiao M, Snoussi H (2018) A fast and robust convolutional neural network-based defect detection model in product quality control. Int J Adv Manuf Technol 94:3465–3471

4. He K, Zhang X, Ren S, Sun J (2016) Deep residual learning for image recognition. Proc IEEE Conf Comput Vis Pattern Recognit 770–778

5. He K, Gkioxari G, Dollár P, Girshick R (2017) Mask r-cnn. Proc IEEE Int Conf Comput Vis 2961–2969

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