Recycled Counterfeit Chips Detection for AMS and Digital ICs Using Low-Area, Self-Contained, and Secure LDO Odometers
Author:
Funder
Air Force’s Center of Excellence for Enabling Cyber Defense in Analog and Mixed Signal Domain
Publisher
Springer Science and Business Media LLC
Link
https://link.springer.com/content/pdf/10.1007/s41635-024-00152-8.pdf
Reference33 articles.
1. Guin U, Forte D, Tehranipoor MM (2013) Anti-counterfeit techniques: from design to resign. In 2013 14th International workshop on microprocessor test and verification pp 89–94
2. Guin U, DiMase D, Tehranipoor M (2014) Counterfeit integrated circuits: detection, avoidance, and the challenges ahead. J Electron Testing 30:9–23
3. Ghosh P, Chakraborty RS (2019) Recycled and remarked counterfeit integrated circuit detection by image-processing-based package texture and indent analysis. IEEE Trans Ind Inform 15:1966–1974
4. Ghosh P, Botero UJ, Ganji F, Woodard D, Chakraborty RS, Forte D (2020) Automated detection and localization of counterfeit chip defects by texture analysis in infrared
5. (IR) domain. In 2020 IEEE physical assurance and inspection of electronics (PAINE) pp 1-6
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