A Study on the Temperature-Dependent Operation of Fluorite-Structure-Based Ferroelectric HfO2 Memory FeFET: Pyroelectricity and Reliability-Reference-Cited by-同舟云学术

A Study on the Temperature-Dependent Operation of Fluorite-Structure-Based Ferroelectric HfO2 Memory FeFET: Pyroelectricity and Reliability

Published:2020-07 Issue:7 Volume:67 Page:2981-2987
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Ali T.¹^ORCID,Kuhnel K.¹,Czernohorsky M.¹,Mart C.¹^ORCID,Rudolph M.¹,Patzold B.¹,Lehninger D.¹,Olivo R.¹,Lederer M.¹^ORCID,Muller F.¹,Hoffmann R.¹,Metzger J.²,Binder R.²,Steinke P.¹,Kampfe T.¹,Muller J.²,Seidel K.¹,Eng L. M.³^ORCID

Affiliation:

1. Center Nanoelectronic Technologies (CNT), Fraunhofer Institute for Photonic Microsystems, Dresden, Germany

2. GLOBALFOUNDRIES Fab1 LLC & Company KG, Dresden, Germany

3. Institut für Angewandte Physik, Technische Universität Dresden, Dresden, Germany

Funder

Globalfoundries Dresden Module One with in the framework Important Project of Common European Interest (IPCEI) by the Federal Ministry for Economics and Energy

State of Saxony

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/9121781/09106817.pdf?arnumber=9106817

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