Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Cited by
29 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Link Testing: a Survey of Current Trends in Network on Chip;Journal of Electronic Testing;2017-03-10
2. NoC Verification and Testing;Designing 2D and 3D Network-on-Chip Architectures;2013-10-09
3. Power and Thermal Effects and Management;Designing 2D and 3D Network-on-Chip Architectures;2013-10-09
4. Introduction to Energy-Efficient Fault-Tolerant Systems;Energy-Efficient Fault-Tolerant Systems;2013-07-12
5. Test Path Selection for Capturing Delay Failures Under Statistical Timing Model;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2013-07