Author:
Bramnik Arkady,Sherban Andrei,Seifert Norbert
Cited by
10 articles.
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1. Resiliency in Digital Processing Systems;2023 IEEE 33rd International Conference on Microelectronics (MIEL);2023-10-16
2. Research on Fast Simulation Method of Single Event Effect Based on Multi-point Injection Method;2023 5th International Conference on Radiation Effects of Electronic Devices (ICREED);2023-05-24
3. Soft Error Sensibility Window at FinFET DICE SRAM;2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS);2021-02-21
4. On the Measurement of Safe Fault Failure Rates in High-Performance Compute Processors;2020 IEEE International Test Conference (ITC);2020-11-01
5. Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology;IEEE Transactions on Circuits and Systems I: Regular Papers;2020-02