Follow-On Testing of the Xilinx Versal Prime-Reference-Cited by-同舟云学术

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Follow-On Testing of the Xilinx Versal Prime

Published:2023-07 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC)
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Author:

Quinn Heather¹,Corley Charles²,Tompkins George³,Thelen Paul⁴

Affiliation:

1. ISR-3 Space Data Systems,Los Alamos National Laboratory,Los Alamos,NM,USA,87545

2. University of Texas at Austin,Department of Electrical & Computer Engineering,Austin,TX,USA,78712

3. Los Alamos National Laboratory,Los Alamos,NM,USA,87545

4. Sandia National Laboratories,Albuquerque,NM,USA

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10265810/10265811/10265849.pdf?arnumber=10265849

Reference27 articles.

1. Raspberry Pi Zero and 3B+ SEE and TID Test Results

2. Accelerated Nuclear Radiation Effects on the Raspberry Pi 3B+

3. A Framework for Fault Tolerance in RISC-V

4. Bridging RHA Methodology From Component to System Level Applied to System-on-Modules

5. SEE test results for Maestro micro-processor;guertin;Proc 7th European Conf Radiation and Its Effects on Components and Systems (RADECS),0

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Measuring Zero: Neutron Testing of Modern Digital Electronics;IEEE Transactions on Nuclear Science;2024-04

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