Bridging RHA Methodology From Component to System Level Applied to System-on-Modules
Author:
Affiliation:
1. IES, CNRS, University of Montpellier, Montpellier, France
2. Department of Physics, University of Oslo, Oslo, Norway
Funder
European Union’s Horizon 2020 Research and Innovation Programme through the Marie-Skolodowska-Curie
Occitanie Region through the PRESERVE Project
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Link
http://xplorestaging.ieee.org/ielx7/23/9830892/09684406.pdf?arnumber=9684406
Reference41 articles.
1. Proton-Induced Upsets in SLC and MLC NAND Flash Memories
2. Microbeam Heavy-Ion Single-Event Effect on Xilinx 28-nm System on Chip
3. Dynamic SEE Testing of Selected Architectural Features of Xilinx 28 nm Virtex-7 FPGAs
4. Single Event Upset Characterization of the Kintex-7 Field Programmable Gate Array Using Proton Irradiation
5. The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis
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