Author:
Sung-Wook Park ,Sung-Joo Hong ,Jin-Woong Kim ,Jae-Goan Jeong ,Kyung-Dong Yoo ,Seung-Chan Moon ,Hyun-Chul Sohn ,Noh-Jung Kwak ,Yun-Seok Cho ,Seung-Joo Baek ,Hyung-Soon Park ,Hyo Geun Yoon ,Bong-Hoon Lee ,Jin-Soo Kim ,Sun-Hwan Hwang ,Lae-Hee Lee ,Heung-Jae Cho ,Sung Yoon Cho ,Chai-O Chung ,Kwang-Ok Kim ,Min-Soo Yoo ,Se-Aug Jang ,Sang-Don Lee ,Sung-Woong Chung ,Sung-Wook Park ,Sung-Joo Hong ,Jin-Woong Kim ,Jae-Goan Jeong ,Kyung-Dong Yoo ,Seung-Chan Moon ,Hyun-Chul Sohn ,Noh-Jung Kwak ,Yun-Seok Cho ,Seung-Joo Baek ,Hyung-Soon Park ,Hyo Geun Yoon ,Bong-Hoon Lee ,Jin-Soo Kim ,Sun-Hwan Hwang ,Lae-Hee Lee ,Heung-Jae Cho ,Sung Yoon Cho ,Chai-O Chung ,Kwang-Ok Kim ,Min-Soo Yoo ,Se-Aug Jang ,Sang-Don Lee ,Sung-Woong Chung
Cited by
2 articles.
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1. Process Condition Effects on Saddle Fin Profile and Its Device Performance Below 20nm Advanced DRAM;2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM);2023-03-07
2. GIDL Analysis of 1T1C Structure for Sub-20nm DRAM Cell;2022 IEEE 16th International Conference on Anti-counterfeiting, Security, and Identification (ASID);2022-12-02