Author:
Dekker R.,Beenker F.,Thijssen L.
Cited by
21 articles.
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1. Fine-Grained Built-In Self-Repair Techniques for NAND Flash Memories;2022 IEEE International Test Conference (ITC);2022-09
2. Basics of Functional RAM Testing;Multi-run Memory Tests for Pattern Sensitive Faults;2018-07-07
3. Managing Test Coverage Uncertainty due to Random Noise in Nano-CMOS: A Case-Study on an SRAM Array;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2016-01
4. Jump test for metallic CNTs in CNFET-based SRAM;Proceedings of the 52nd Annual Design Automation Conference;2015-06-07
5. Fault-Tolerant Embedded-Memory Strategy for Baseband Signal Processing Systems;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2013-07