Author:
Dekker R.,Beenker F.,Thijssen L.
Cited by
22 articles.
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1. Word-Oriented Memory Test and Coupling Fault Coverage: a RAW and RAW1 Case Study;2024 Panhellenic Conference on Electronics & Telecommunications (PACET);2024-03-28
2. Fine-Grained Built-In Self-Repair Techniques for NAND Flash Memories;2022 IEEE International Test Conference (ITC);2022-09
3. Basics of Functional RAM Testing;Multi-run Memory Tests for Pattern Sensitive Faults;2018-07-07
4. Managing Test Coverage Uncertainty due to Random Noise in Nano-CMOS: A Case-Study on an SRAM Array;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2016-01
5. Jump test for metallic CNTs in CNFET-based SRAM;Proceedings of the 52nd Annual Design Automation Conference;2015-06-07