Managing Test Coverage Uncertainty due to Random Noise in Nano-CMOS: A Case-Study on an SRAM Array
-
Published:2016-01
Issue:1
Volume:35
Page:155-165
-
ISSN:0278-0070
-
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
-
language:
-
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.
Author:
Suresh Vikram B.,Kundu Sandip
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software