Process Variation and Pelgrom's Law [Circuit Intuitions]-Reference-Cited by-同舟云学术

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Process Variation and Pelgrom's Law [Circuit Intuitions]

Published:2015 Issue:1 Volume:7 Page:8-9
ISSN:1943-0582
Container-title:IEEE Solid-State Circuits Magazine
language:
Short-container-title:IEEE Solid-State Circuits Mag.

Author:

Sheikholeslami Ali

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/4563670/7036159/07036179.pdf?arnumber=7036179

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Digital Calibration of Input Offset Voltage and Its Implementation in FDDA Circuits;Electronics;2023-11-11

2. Mismatch Driven Systematic Design Methodology for Transistor Based Active Resistors;2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS);2023-08-06

3. A 0.15-to-0.5 V Body-Driven Dynamic Comparator with Rail-to-Rail ICMR;Journal of Low Power Electronics and Applications;2023-05-11

4. A comprehensive Pelgrom-based on-current variability model for FinFET, NWFET and NSFET;Solid-State Electronics;2023-01

5. A Novel Domino Logic Based on Floating-Gate MOS Transistors;Jordan Journal of Electrical Engineering;2023

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