On the Impact of the Biasing History on the Characterization of Random Telegraph Noise-Reference-Cited by-同舟云学术

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On the Impact of the Biasing History on the Characterization of Random Telegraph Noise

Published:2022 Issue: Volume:71 Page:1-10
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Saraza-Canflanca Pablo¹^ORCID,Castro-Lopez Rafael¹^ORCID,Roca Elisenda¹^ORCID,Martin-Martinez Javier²^ORCID,Rodriguez Rosana²^ORCID,Nafria Montserrat²^ORCID,Fernandez Francisco V.¹^ORCID

Affiliation:

1. Instituto de Microelectrónica de Sevilla (Consejo Superior de Investigaciones Científicas and Universidad de Sevilla), Seville, Spain

2. Electronic Engineering Department (REDEC) Group, Universitat Autónoma de Barcelona (UAB), Barcelona, Spain

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/9717300/09784449.pdf?arnumber=9784449

Reference19 articles.

1. A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level

2. TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level

3. Impact of Sampling Rate on RTN Time Constant Extraction and Its Implications on Bias Dependence and Trap Spectroscopy

4. Guidelines for a Reliable Analysis of Random Telegraph Noise in Electronic Devices

5. Modeling of Random Telegraph Noise under circuit operation — Simulation and measurement of RTN-induced delay fluctuation

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