Characterization of logical masking and error propagation in combinational circuits and effects on system vulnerability
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx5/5949577/5958196/05958246.pdf?arnumber=5958246
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4. Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS Circuits;Journal of Electronic Testing;2019-04
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